The chemical state identification is conventionally done by comparing the extracted binding energy (BE) values to compound reference data bases such as the NIST XPS 7. However, significant fraction of these numerous XPS papers contains data that have been wrongly interpreted due to the lack of skills, experience, or knowledge 5, but also because an improper referencing method was employed 6. The tremendous growth of the XPS technique is driven by the possibility of chemical state identification 2, 3, enabled nearly 60 years ago by the first observation of S 2p peak splitting in the XPS spectrum of sodium thiosulfate 4, caused by the fact that S atoms in Na 2S 2O 3 are present in two distinctly different chemical environments.
With more than 12,000 papers published annually, the value of XPS in materials science can hardly be overestimated 1.
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